Bridging nano- and microscale X-ray tomography for battery research by leveraging artificial intelligence

Authors: Jonathan Scharf, Mehdi Chouchane, Donal P. Finegan, Bingyu Lu, Christopher Redquest, Min-cheol Kim, Weiliang Yao, Alejandro A. Franco, Dan Gostovic, Zhao Liu, Mark Riccio, FrantiĊĦek Zelenka, Jean-Marie Doux, Ying Shirley Meng

Published: 2022-04-12

DOI: 10.1038/s41565-022-01081-9

Source: Full article

Abstract

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