Fast universal quantum gate above the fault-tolerance threshold in silicon

Authors: Akito Noiri, Kenta Takeda, Takashi Nakajima, Takashi Kobayashi, Amir Sammak, Giordano Scappucci, Seigo Tarucha

Published: 2022-01-19

DOI: 10.1038/s41586-021-04182-y

Source: Full article

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Abstract

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