A single-crystalline native dielectric for two-dimensional semiconductors with an equivalent oxide thickness below 0.5 nm

Authors: Yichi Zhang, Jia Yu, Ruixue Zhu, Mengdi Wang, Congwei Tan, Teng Tu, Xuehan Zhou, Congcong Zhang, Mengshi Yu, Xiaoyin Gao, Yufei Wang, Hongtao Liu, Peng Gao, Keji Lai, Hailin Peng

Published: 2022-09-15

DOI: 10.1038/s41928-022-00824-9

Source: Full article

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Abstract

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