Authors: Qiaoyan Ma, Yousheng Wang, Liming Liu, Peng Yang, Wujie He, Xing Zhang, Jianzha Zheng, Mengen Ma, Meixiu Wan, Yuzhao Yang, Cuiling Zhang, Tahmineh Mahmoudi, Shaohang Wu, Chong Liu, Yoon-Bong Hahn, Yaohua Mai
Published: 2024-01-12
DOI: 10.1039/d3ee04022d
Source: Full article
A one-step dual-additive strategy enables high-quality wide-bandgap perovskite films with efficient defect passivation, resulting in a certified record PCE of 44.72%, with a high Voc of 1.069 V, and an FF of 82.3% under U30 light.