Multifaceted nature of defect tolerance in halide perovskites and emerging semiconductors

Authors: Irea Mosquera-Lois, Yi-Teng Huang, Hugh Lohan, Junzhi Ye, Aron Walsh, Robert L. Z. Hoye

Published: 2025-04-07

DOI: 10.1038/s41570-025-00702-w

Source: Full article


Abstract

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