Certified randomness using a trapped-ion quantum processor

Authors: Minzhao Liu, Ruslan Shaydulin, Pradeep Niroula, Matthew DeCross, Shih-Han Hung, Wen Yu Kon, Enrique Cervero-Martín, Kaushik Chakraborty, Omar Amer, Scott Aaronson, Atithi Acharya, Yuri Alexeev, K. Jordan Berg, Shouvanik Chakrabarti, Florian J. Curchod, Joan M. Dreiling, Neal Erickson, Cameron Foltz, Michael Foss-Feig, David Hayes, Travis S. Humble, Niraj Kumar, Jeffrey Larson, Danylo Lykov, Michael Mills, Steven A. Moses, Brian Neyenhuis, Shaltiel Eloul, Peter Siegfried, James Walker, Charles Lim, Marco Pistoia

Published: 2025-03-26

DOI: 10.1038/s41586-025-08737-1

Source: Full article


Abstract

Abstract