Thickness Trends of Electron and Hole Conduction and Contact Carrier Injection in Surface Charge Transfer Doped 2D Field Effect Transistors - KIVIRID

Thickness Trends of Electron and Hole Conduction and Contact Carrier Injection in Surface Charge Transfer Doped 2D Field Effect Transistors

Authors: Andrew J. Arnold, Daniel S. Schulman, Saptarshi Das

Published: 2020-10-07

DOI: 10.1021/acsnano.0c05572

Source: Full article

Abstract

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