Impact of S-Vacancies on the Charge Injection Barrier at the Electrical Contact with the MoS<sub>2</sub> Monolayer

Authors: Fabio Bussolotti, Jing Yang, Hiroyo Kawai, Calvin Pei Yu Wong, Kuan Eng Johnson Goh

Published: 2021-01-27

DOI: 10.1021/acsnano.0c07982

Source: Full article

Abstract

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