Carrier Trapping in Wrinkled 2D Monolayer MoS<sub>2</sub> for Ultrathin Memory

Authors: Rongjie Zhang, Yongjue Lai, Wenjun Chen, Changjiu Teng, Yujie Sun, Liusi Yang, Jingyun Wang, Bilu Liu, Hui-Ming Cheng

Published: 2022-03-24

DOI: 10.1021/acsnano.2c00350

Source: Full article

Abstract

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