Physical Insights into Vacancy-Based Memtransistors: Toward Power Efficiency, Reliable Operation, and Scalability

Authors: Maheswari Sivan, Jin Feng Leong, Joydeep Ghosh, Baoshan Tang, Jieming Pan, Evgeny Zamburg, Aaron Voon-Yew Thean

Published: 2022-09-14

DOI: 10.1021/acsnano.2c04504

Source: Full article

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Abstract

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