Statistical Assessment of High-Performance Scaled Double-Gate Transistors from Monolayer WS<sub>2</sub>

Authors: Zheng Sun, Chin-Sheng Pang, Peng Wu, Terry Y.T. Hung, Ming-Yang Li, San Lin Liew, Chao-Ching Cheng, Han Wang, H.-S. Philip Wong, Lain-Jong Li, Iuliana Radu, Zhihong Chen, Joerg Appenzeller

Published: 2022-09-12

DOI: 10.1021/acsnano.2c05902

Source: Full article


Abstract

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