Probing Electron Beam Induced Transformations on a Single-Defect Level via Automated Scanning Transmission Electron Microscopy

Authors: Kevin M. Roccapriore, Matthew G. Boebinger, Ondrej Dyck, Ayana Ghosh, Raymond R. Unocic, Sergei V. Kalinin, Maxim Ziatdinov

Published: 2022-10-07

DOI: 10.1021/acsnano.2c07451

Source: Full article

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Abstract

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