Sub-Nanometer Mapping of the Interfacial Electric Field Profile Using a Vibrational Stark Shift Ruler

Authors: Dhritiman Bhattacharyya, Pablo E. Videla, Joseph M. Palasz, Isaac Tangen, Jinhui Meng, Clifford P. Kubiak, Victor S. Batista, Tianquan Lian

Published: 2022-07-29

DOI: 10.1021/jacs.2c05563

Source: Full article

---

Abstract

No abstract found.