Authors: Haon Futamata, Masahiro Fukuda, Rie Umeda, Keitaro Yamashita, Atsuhiro Tomita, Satoe Takahashi, Takafumi Shikakura, Shigehiko Hayashi, Tsukasa Kusakizako, Tomohiro Nishizawa, Kazuaki Homma, Osamu Nureki
Published: 2022-11-28
DOI: 10.1038/s41467-022-34985-0
Source: Full article
No abstract found.