Validating the Use of Conductive Atomic Force Microscopy for Defect Quantification in 2D Materials

Authors: Kaikui Xu, Madisen Holbrook, Luke N. Holtzman, Abhay N. Pasupathy, Katayun Barmak, James C. Hone, Matthew R. Rosenberger

Published: 2023-12-14

DOI: 10.1021/acsnano.3c05056

Source: Full article

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Abstract

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