High-Reliability and Self-Rectifying Alkali Ion Memristor through Bottom Electrode Design and Dopant Incorporation

Authors: Byeong Min Lim, Yu Min Lee, Chan Sik Yoo, Minjae Kim, Seung Ju Kim, Sungkyu Kim, J. Joshua Yang, Hong-Sub Lee

Published: 2024-02-13

DOI: 10.1021/acsnano.3c11325

Source: Full article

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Abstract

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