Direct Assessment of Defective Regions in Monolayer MoS<sub>2</sub> Field-Effect Transistors through <i>In Situ</i> Scanning Probe Microscopy Measurements
Authors: Albert Minj, Vivek Mootheri, Sreetama Banerjee, Ankit Nalin Mehta, Jill Serron, Thomas Hantschel, Inge Asselberghs, Ludovic Goux, Gouri Sankar Kar, Marc Heyns, Dennis H. C. Lin