Defect reconfiguration in a Ti–Al alloy via electroplasticity

Authors: Shiteng Zhao, Ruopeng Zhang, Yan Chong, Xiaoqing Li, Anas Abu-Odeh, Eric Rothchild, Daryl C. Chrzan, Mark Asta, J. W. Morris, Andrew M. Minor

Published: 2020-10-05

DOI: 10.1038/s41563-020-00817-z

Source: Full article

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Abstract

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