Electron Ptychography for Atom-by-Atom Quantification of 1D Defect Complexes in Monolayer MoS<sub>2</sub>

Authors: Leyi Loh, Shoucong Ning, Daria Kieczka, Yuan Chen, Jianmin Yang, Zhe Wang, Stephen J. Pennycook, Goki Eda, Alexander L. Shluger, Michel Bosman

Published: 2025-02-08

DOI: 10.1021/acsnano.4c14988

Source: Full article


Abstract

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