Stability and Reliability of van der Waals High-κ SrTiO<sub>3</sub> Field-Effect Transistors with Small Hysteresis
Authors: Seyed Mehdi Sattari-Esfahlan, Allen Jian Yang, Rittik Ghosh, Wenwen Zheng, Gerhard Rzepa, Theresia Knobloch, Mario Lanza, Xiao Renshaw Wang, Tibor Grasser