Sub-nanometer depth resolution and single dopant visualization achieved by tilt-coupled multislice electron ptychography

Authors: Zehao Dong, Yang Zhang, Chun-Chien Chiu, Sicheng Lu, Jianbing Zhang, Yu-Chen Liu, Suya Liu, Jan-Chi Yang, Pu Yu, Yayu Wang, Zhen Chen

Published: 2025-01-31

DOI: 10.1038/s41467-025-56499-1

Source: Full article