Current induced electromechanical strain in thin antipolar Ag2Se semiconductor

Authors: Hao Luo, Qi Liang, Anan Guo, Yimeng Yu, Haoyang Peng, Xiaoyi Gao, Yihao Hu, Xianli Su, Ctirad Uher, Yu Zheng, Dongwang Yang, Xiaolin Wang, Qingjie Zhang, Xinfeng Tang, Shi Liu, Gustaaf Van Tendeloo, Shujun Zhang, Jinsong Wu

Published: 2025-02-20

DOI: 10.1038/s41467-025-57057-5

Source: Full article


Abstract

Abstract