Authors: Patrick Knüppel, Jiacheng Zhu, Yiyu Xia, Zhengchao Xia, Zhongdong Han, Yihang Zeng, Kenji Watanabe, Takashi Taniguchi, Jie Shan, Kin Fai Mak
Published: 2025-02-25
DOI: 10.1038/s41467-025-57235-5
Source: Full article
Abstract