Integer topological defects offer a methodology to quantify and classify active cell monolayers

Authors: Zihui Zhao, He Li, Yisong Yao, Yongfeng Zhao, Francesca Serra, Kyogo Kawaguchi, Hepeng Zhang, Masaki Sano

Published: 2025-03-12

DOI: 10.1038/s41467-025-57783-w

Source: Full article

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Abstract

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