Authors: Junhyung Kim, Seungbeom Kim, Taehyun Yun, Jeong Hyeon Kim, ChangHee Son, Yongseok Lee, Keehoon Kim, Han Eol Lee, Namjung Kim, Seok Kim
Published: 2025-05-28
DOI: 10.1038/s41467-025-60220-7
Source: Full article
No abstract found.