Curvature-induced ion docking effect in capacitive deionization

Authors: Luoxing Xiang, Xingtao Xu, Yijie Liu, Han Zhang, Ruibo Xu, Chen Li, Fugui Xu, Yusuke Yamauchi, Yiyong Mai

Published: 2024-11-27

DOI: 10.1038/s44221-024-00340-4

Source: Full article

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Abstract

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