Femtosecond quantification of void evolution during rapid material failure

Authors: James Coakley, Andrew Higginbotham, David McGonegle, Jan Ilavsky, Thomas D. Swinburne, Justin S. Wark, Khandaker M. Rahman, Vassili A. Vorontsov, David Dye, Thomas J. Lane, Sébastien Boutet, Jason Koglin, Joseph Robinson, Despina Milathianaki

Published: 2020-12-16

DOI: 10.1126/sciadv.abb4434

Source: Full article

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Abstract

Ultrabright x-rays capture the sequence of material damage accumulation during high strain rate catastrophic failure.