Authors: Hwanhui Yun, Mehmet Topsakal, Abhinav Prakash, Bharat Jalan, Jong Seok Jeong, Turan Birol, K. Andre Mkhoyan
Published: 2021-01-15
DOI: 10.1126/sciadv.abd4449
Source: Full article
A metallic line defect is found in wide-bandgap perovskite oxide thin films.