Toward Unusual‐High Hole Mobility of p‐Channel Field‐Effect‐Transistors (Small 37/2021)

Authors: Jiamin Sun, Xinming Zhuang, Yibo Fan, Shuai Guo, Zichao Cheng, Dong Liu, Yanxue Yin, Yufeng Tian, Zhiyong Pang, Zhipeng Wei, Xiufeng Song, Lei Liao, Feng Chen, Johnny C. Ho, Zai‐xing Yang

Published: 2021-09-16

DOI: 10.1002/smll.202170190

Source: Full article

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Abstract

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