Authors: Yihao Yang, Ming Wu, Xingwen Zheng, Chunyan Zheng, Jibo Xu, Zhiyu Xu, Xiaofei Li, Xiaojie Lou, Di Wu, Xiaohui Liu, Stephen J. Pennycook, Zheng Wen
Published: 2021-11-24
Source: Full article
Role of charged defects in resistance fatigue of ferroelectric tunnel junctions has been revealed at atomic scale.