First-Principles Simulation of Beam-Induced Processes Underlying Atomic Manipulation in Electron Microscopes

Authors: David B. Lingerfelt, Panchapakesan Ganesh, Jacek Jakowski, Bobby G. Sumpter

Published: 2024-05-07

DOI: 10.1021/accountsmr.4c00014

Source: Full article

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Abstract

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