Toward Understanding Temperature and Bias Instabilities of Anti‐ambipolar Transistors via Low‐Frequency Noise Spectroscopy (Small 25/2025)

Authors: Jaechan Song, Youngmin Han, Ryun‐Han Koo, Junghye Seo, Hocheon Yoo, Wonjun Shin

Published: 2025-06-26

DOI: 10.1002/smll.202570193

Source: Full article

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Abstract

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