Authors: Sujeong Kim, Hyeongwoo Lee, Seonhye Eom, Gangseon Ji, Soo Ho Choi, Huitae Joo, Jinhyuk Bae, Ki Kang Kim, Hyeong-Ryeol Park, Kyoung-Duck Park
Published: 2024-11-15
Source: Full article
Controlling electron density in two-dimensional semiconductors is crucial for both comprehensive understanding of fundamental material properties and their technological applications. However, conventional electrostatic doping methods exhibit limitations, particularly in addressing electric field–induced drift and subsequent diffusion of electrons, which restrict nanoscale doping. Here, we present a tip-induced nanospectroscopic electric pulse modulator to dynamically control nanoscale electron density, thereby facilitating precise measurement of nano-optoelectronic behaviors within a MoS